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We have the industry standard ToFSIMS 5 imaging instrument from IONTOF equipped with a bismuth cluster ion gun for sub-micron imaging along with a Cs/C60 sputter gun for depth profiling of organic and inorganic materials. We were also the 3rd laboratory in the world to take delivery of a J105 ToF-SIMS instrument from Ionoptika. This instrument has sample handling capabilities that are optimised for biological specimen. The J105 uses quasi-continuous primary ion beams (curently C60 and Ar2500) and bridges the gap between static and dynamic SIMS instrumentation.

MALDI imaging capability is provided by a Bruker Ultraflextreme instrument. This ToF-ToF instrument uses the Bruker “Smart Beam” technology to offer imaging at 10-15 micron imaging resolution.

We now have the first Cameca NanoSIMS instrument in Scandinavia which is capable of high precsion isotope imaging down to 50 nm spatial resolution.

Page Manager: Erika Hoff|Last update: 4/21/2017

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